Atomic force microscopy study to explore interface-driven electrical and physical changes in perovskite films on top of dielectric nanoparticles
1
Issued Date
2026-06-01
Resource Type
ISSN
00214922
eISSN
13474065
Scopus ID
2-s2.0-105041002872
Journal Title
Japanese Journal of Applied Physics Part 1 Regular Papers and Short Notes and Review Papers
Volume
65
Issue
11
Rights Holder(s)
SCOPUS
Bibliographic Citation
Japanese Journal of Applied Physics Part 1 Regular Papers and Short Notes and Review Papers Vol.65 No.11 (2026)
Suggested Citation
Tun P.T., Thant K.K.S., Choodam K., Kanjanaboos P. Atomic force microscopy study to explore interface-driven electrical and physical changes in perovskite films on top of dielectric nanoparticles. Japanese Journal of Applied Physics Part 1 Regular Papers and Short Notes and Review Papers Vol.65 No.11 (2026). doi:10.35848/1347-4065/ae6aaa Retrieved from: https://repository.li.mahidol.ac.th/handle/123456789/117285
Title
Atomic force microscopy study to explore interface-driven electrical and physical changes in perovskite films on top of dielectric nanoparticles
Author(s)
Corresponding Author(s)
Other Contributor(s)
Abstract
To improve the efficiency of perovskite solar cells, key strategies include optimizing the deposition process, introducing interlayer passivation, incorporating new materials, and employing light-trapping mechanisms. Recent studies have shown that adding dielectric materials such as Al<inf>2</inf>O<inf>3</inf> or SiO<inf>2</inf> nanoparticles as interlayer between the charge transport layer and the active layer can navigate the current flow pathways by passivating interface trap states. This strategy enhances charge carrier extraction and reduces recombination at the perovskite/electron transport layer (ETL) interface, ultimately contributing to improved device efficiency. In this study, we introduced dielectric materials like SiO<inf>2</inf> nanoparticles as the interfacial passivation layer between the ETL and the perovskite absorber to investigate their influence on the films’ electrical and physical properties using atomic force microscopy. Specifically, we examined changes in local conductivity, work function, and mechanical characteristics of the perovskite films, gaining insights about charge transfer mechanisms between grains and solar cell layers.