Publication:
Trace-level determination and insight in speciation of silicon in petrochemical samples by flow-injection high resolution ICP MS and HPLC-high resolution ICP MS

dc.contributor.authorPawel Pohlen_US
dc.contributor.authorNopparat Vorapalawuten_US
dc.contributor.authorBrice Bouyssiereen_US
dc.contributor.authorRyszard Lobinskien_US
dc.contributor.otherUniversite de Pau et des Pays de L'Adouren_US
dc.contributor.otherWrocław University of Science and Technologyen_US
dc.contributor.otherMahidol Universityen_US
dc.contributor.otherPolitechnika Warszawskaen_US
dc.date.accessioned2018-09-24T08:53:26Z
dc.date.available2018-09-24T08:53:26Z
dc.date.issued2010-09-01en_US
dc.description.abstractA method for the determination of silicon in organic solutions was developed using a double focusing magnetic sector ICP MS operating at a resolution of 4000. The signal-to-background ratio was improved 10-fold over standard sample introduction systems by the use of micro-flow injection total consumption sample introduction. The detection limits down to 1 ng g -1, the calibration graph linear over 4 orders of magnitude and precision to within a few percent were obtained. The effects of the sample matrix and of the chemical form of silicon on the sensitivity were investigated and alleviated when necessary by heating the spray chamber and sample dilution. Normal phase HPLC-ICP MS and size-exclusion ICP MS were proposed to gain an insight into the purity of the silicon standard compounds, their reactivity with different petroleum-related matrices and speciation of silicon. © 2010 The Royal Society of Chemistry.en_US
dc.identifier.citationJournal of Analytical Atomic Spectrometry. Vol.25, No.9 (2010), 1461-1466en_US
dc.identifier.doi10.1039/c005010een_US
dc.identifier.issn13645544en_US
dc.identifier.issn02679477en_US
dc.identifier.other2-s2.0-77955810479en_US
dc.identifier.urihttps://repository.li.mahidol.ac.th/handle/20.500.14594/28925
dc.rightsMahidol Universityen_US
dc.rights.holderSCOPUSen_US
dc.source.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=77955810479&origin=inwarden_US
dc.subjectChemistryen_US
dc.titleTrace-level determination and insight in speciation of silicon in petrochemical samples by flow-injection high resolution ICP MS and HPLC-high resolution ICP MSen_US
dc.typeConference Paperen_US
dspace.entity.typePublication
mu.datasource.scopushttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=77955810479&origin=inwarden_US

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