Publication:
Dual problems: Attribute selection and example selection

dc.contributor.authorPuntip Pattaraintakomen_US
dc.contributor.authorKanlaya Naruedomkulen_US
dc.contributor.authorNick Gereoneen_US
dc.contributor.otherMahidol Universityen_US
dc.contributor.otherDalhousie Universityen_US
dc.date.accessioned2018-07-24T03:41:14Z
dc.date.available2018-07-24T03:41:14Z
dc.date.issued2004-12-01en_US
dc.description.abstractWe proposed an alternative methodology, Dual AE, for attribute selection and example selection. The Dual AE is designed to increase the accuracy and efficiency of attribute selection and example selection. The central idea behind the Dual AE is to generate the attribute candidates by "Attribute candidate generation" after the data were cleaned in "Data pre-processing module". All the candidates are weighted in the "Attribute weighting" so that the most informative attribute set can be selected in "Clustering". The accuracy of the selected attribute set is verified in the last module, "Validation". To demonstrate the Dual AE method, we have implemented it on the prototypical data set. In this paper we present the intuitions behind the design of Dual AE and some experimental results.en_US
dc.identifier.citationProceedings of the International Conference on Internet Computing, IC'04. Vol.1, (2004), 60-65en_US
dc.identifier.other2-s2.0-12744274418en_US
dc.identifier.urihttps://repository.li.mahidol.ac.th/handle/123456789/21315
dc.rightsMahidol Universityen_US
dc.rights.holderSCOPUSen_US
dc.source.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=12744274418&origin=inwarden_US
dc.subjectEngineeringen_US
dc.titleDual problems: Attribute selection and example selectionen_US
dc.typeConference Paperen_US
dspace.entity.typePublication
mu.datasource.scopushttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=12744274418&origin=inwarden_US

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