Publication: Multi-scaled microstructures in natural rubber characterized by synchrotron X-ray scattering and optical microscopy
Issued Date
2008-11-15
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ISSN
08876266
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2-s2.0-56349131774
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Mahidol University
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SCOPUS
Bibliographic Citation
Journal of Polymer Science, Part B: Polymer Physics. Vol.46, No.22 (2008), 2456-2464
Suggested Citation
Shigeyuki Toki, Christian Burger, Benjamin S. Hsiao, Sureerut Amnuaypornsri, Jitladda Sakdapipanich, Yasuyuki Tanaka Multi-scaled microstructures in natural rubber characterized by synchrotron X-ray scattering and optical microscopy. Journal of Polymer Science, Part B: Polymer Physics. Vol.46, No.22 (2008), 2456-2464. doi:10.1002/polb.21578 Retrieved from: https://repository.li.mahidol.ac.th/handle/20.500.14594/19057
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Title
Multi-scaled microstructures in natural rubber characterized by synchrotron X-ray scattering and optical microscopy
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Abstract
Multi-scaled microstructures induced by natural impurities (i.e., proteins, phospholipids, carbohydrates) in natural rubber (NR) were investigated by synchrotron small-angle X-ray scattering (SAXS), wide-angle X-ray diffraction (WAXD), and optical microscopy using several kinds of untreated and chemically treated un-vulcanized samples. These microstructures include large aggregates (size less than 50 μm), well-defined crystals (size less than a few 10 μm), and micelles (size much less than 10 μm). In un-vulcanized NR samples, even though the concentrations of natural impurities are relatively low, the dispersion of these microstructures significantly affects the mechanical properties. © 2008 Wiley Periodicals, Inc.