Publication:
Inhibition of Culex quinquefasciatus (Diptera: Culicidae) viability by nanosecond pulsed electric field radiation

dc.contributor.authorNakarin Pinpathomraten_US
dc.contributor.authorTeerayut Kaweeferngfuen_US
dc.contributor.authorAtthawit Laphodomen_US
dc.contributor.authorN. E. Islamen_US
dc.contributor.authorPhumin Kirawanichen_US
dc.contributor.otherMahidol Universityen_US
dc.contributor.otherUniversity of Missouri-Columbiaen_US
dc.date.accessioned2018-05-03T08:01:15Z
dc.date.available2018-05-03T08:01:15Z
dc.date.issued2011-08-01en_US
dc.description.abstractRadiation effects of high-intensity nanosecond pulsed electric fields on the viability of Culex quinquefasciatus (Diptera: Culicidae) were determined. Statistical analyses from results show that the treatment energy density of up to 17.76 J m -3 produced the optimum result in which the number of survived mosquitoes was decreased by 20% (P < 0.05). Furthermore, the average developmental rate into adult forms of treated fourth-instart lavae was found lower compared to that of the control (P < 0.05). The present study indicates that electrical pulse characteristics, especially the pulse amplitude, might be responsible for the decrease in mosquito viability. © 2011 Elsevier B.V.en_US
dc.identifier.citationJournal of Electrostatics. Vol.69, No.4 (2011), 339-344en_US
dc.identifier.doi10.1016/j.elstat.2011.04.012en_US
dc.identifier.issn03043886en_US
dc.identifier.other2-s2.0-79959514828en_US
dc.identifier.urihttps://repository.li.mahidol.ac.th/handle/20.500.14594/11499
dc.rightsMahidol Universityen_US
dc.rights.holderSCOPUSen_US
dc.source.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=79959514828&origin=inwarden_US
dc.subjectBiochemistry, Genetics and Molecular Biologyen_US
dc.subjectEngineeringen_US
dc.subjectMaterials Scienceen_US
dc.subjectPhysics and Astronomyen_US
dc.titleInhibition of Culex quinquefasciatus (Diptera: Culicidae) viability by nanosecond pulsed electric field radiationen_US
dc.typeArticleen_US
dspace.entity.typePublication
mu.datasource.scopushttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=79959514828&origin=inwarden_US

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