Publication: Fabrication and I-V characterization with monochromatic light of multilayer poly(3-hexylthiophene)-CNT/C60 thin films on ITO glass substrate
Issued Date
2013-10-08
Resource Type
ISSN
10226680
Other identifier(s)
2-s2.0-84884970450
Rights
Mahidol University
Rights Holder(s)
SCOPUS
Bibliographic Citation
Advanced Materials Research. Vol.770, (2013), 315-318
Suggested Citation
A. Sansomboon, T. Jungwon, P. Pasitsuparoad, K. Subannajui, T. Osotchan Fabrication and I-V characterization with monochromatic light of multilayer poly(3-hexylthiophene)-CNT/C60 thin films on ITO glass substrate. Advanced Materials Research. Vol.770, (2013), 315-318. doi:10.4028/www.scientific.net/AMR.770.315 Retrieved from: https://repository.li.mahidol.ac.th/handle/20.500.14594/31730
Research Projects
Organizational Units
Authors
Journal Issue
Thesis
Title
Fabrication and I-V characterization with monochromatic light of multilayer poly(3-hexylthiophene)-CNT/C60 thin films on ITO glass substrate
Other Contributor(s)
Abstract
Multilayer poly(3-hexylthiophene)-CNT/C60 thin films on ITO glass substrate was fabricated regarding to the function of each layer. Poly(3-hexylthiophene) (P3HT) is used as a donor layer and fullerene (C60) is used as an acceptor layer of the device. The carbon-nanotube (CNT) is homogeneously mixed in the donor layer to increase charge transportability. The structures of poly(3-hexylthiophene), poly(3-hexylthiophene)-CNT were fabricated in comparison of poly(3-hexylthiophene)-CNT/C60 thin films. The P3HT-CNT bulk heterojunction was deposited on ITO glass substrate by spin coating technique and then the C60 thin film was deposited on the P3HT by thermal evaporating technique. The I-V characteristic of ITO/P3HT-CNT/Al and ITO/P3HT-CNT/C60/Al were investigated in the monochromatic light. The result showed that the ITO/P3HT-CNT/Al structures respond with red and green light, and the ITO/P3HT-CNT/C60/Al structure responds with blue light. The UV absorption was measured and the result was consistence with the I-V characterization. © (2013) Trans Tech Publications, Switzerland.