Publication: FIB-SEM investigation of trapped intermetallic particles in anodic oxide films on AA1050 aluminium
Issued Date
2011-06-01
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00035599
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2-s2.0-79960044737
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Mahidol University
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SCOPUS
Bibliographic Citation
Anti-Corrosion Methods and Materials. Vol.58, No.4 (2011), 173-178
Suggested Citation
M. Jariyaboon, P. Møller, R. E. Dunin-Borkowski, R. Ambat FIB-SEM investigation of trapped intermetallic particles in anodic oxide films on AA1050 aluminium. Anti-Corrosion Methods and Materials. Vol.58, No.4 (2011), 173-178. doi:10.1108/00035591111148885 Retrieved from: https://repository.li.mahidol.ac.th/handle/20.500.14594/11679
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Title
FIB-SEM investigation of trapped intermetallic particles in anodic oxide films on AA1050 aluminium
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Abstract
Purpose: The purpose of this investigation is to understand the structure of trapped intermetallics particles and localized composition changes in the anodized anodic oxide film on AA1050 aluminium substrates. Design/methodology/approach: The morphology and composition of Fe-containing intermetallic particles incorporated into the anodic oxide films on industrially pure aluminium (AA1050, 99.5 per cent) has been investigated. AA1050 aluminium was anodized in a 100 ml/l sulphuric acid bath with an applied voltage of 14 V at 20°C ±2°C for 10 or 120 min. The anodic film subsequently was analyzed using focused ion beam-scanning electron microscopy (FIB-SEM), SEM, and EDX. Findings: The intermetallic particles in the substrate material consisted of Fe or both Fe and Si with two different structures: irregular and round shaped. FIB-SEM cross-sectioned images revealed that the irregular-shaped particles were embedded in the anodic oxide film as a thin strip structure and located near the top surface of the film, whereas the round-shaped particles were trapped in the film with a spherical structure, but partially dissolved and were located throughout the thickness of the anodic film. The Fe/Si ratio of the intermetallic particles decreased after anodizing. Originality/value: This paper shows that dual beam FIB-SEM seems to be an easy, less time consuming and useful method to characterize the cross-sectioned intermetallic particles incorporated in anodic film on aluminium. © Emerald Group Publishing Limited.