Publication:
In situ monitoring of the growth of Cu(In,Ga)Se<inf>2</inf>thin films

dc.contributor.authorChanwit Chityuttakanen_US
dc.contributor.authorPanita Chinvetkitvanichen_US
dc.contributor.authorKajornyod Yoodeeen_US
dc.contributor.authorSomphong Chatraphornen_US
dc.contributor.otherMahidol Universityen_US
dc.date.accessioned2018-08-20T06:58:07Z
dc.date.available2018-08-20T06:58:07Z
dc.date.issued2006-11-23en_US
dc.description.abstractThin films of Cu(In,Ga)Se2were grown by co-evaporation process in a conventional vacuum coating system at the base pressure of 10-5mbar. The controllable of the two-stage growth process was developed. During the growth process, substrate temperature, graphite heater temperature, heating output power and temperature of the CIGS surface were monitored simultaneously. In this setup, we use the change in the thermal behavior of the substrate due to the variations in emissivity of CIGS film during the transition of Cu-rich to Cu-poor in the second stage corresponding to the change of power fed into the substrate heater as the control signal. By observing the variation of control signals, the desired final composition of the film can be obtained. Using our device fabrication, Al/ZnO(Al)/CdS/CIGS/Mo/SLG solar cells with efficiency over 14% (without AR) were achieved. © 2006 Elsevier B.V. All rights reserved.en_US
dc.identifier.citationSolar Energy Materials and Solar Cells. Vol.90, No.18-19 (2006), 3124-3129en_US
dc.identifier.doi10.1016/j.solmat.2006.06.038en_US
dc.identifier.issn09270248en_US
dc.identifier.other2-s2.0-33748323140en_US
dc.identifier.urihttps://repository.li.mahidol.ac.th/handle/20.500.14594/23226
dc.rightsMahidol Universityen_US
dc.rights.holderSCOPUSen_US
dc.source.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=33748323140&origin=inwarden_US
dc.subjectEnergyen_US
dc.subjectMaterials Scienceen_US
dc.titleIn situ monitoring of the growth of Cu(In,Ga)Se<inf>2</inf>thin filmsen_US
dc.typeArticleen_US
dspace.entity.typePublication
mu.datasource.scopushttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=33748323140&origin=inwarden_US

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