Publication: Atomic force microscopy
| dc.contributor.author | M. Duman | en_US |
| dc.contributor.author | I. Neundlinger | en_US |
| dc.contributor.author | R. Zhu | en_US |
| dc.contributor.author | J. Preiner | en_US |
| dc.contributor.author | C. Lamprecht | en_US |
| dc.contributor.author | L. A. Chtcheglova | en_US |
| dc.contributor.author | C. Rankl | en_US |
| dc.contributor.author | T. Puntheeranurak | en_US |
| dc.contributor.author | A. Ebner | en_US |
| dc.contributor.author | P. Hinterdorfer | en_US |
| dc.contributor.other | Johannes Kepler Universitat Linz | en_US |
| dc.contributor.other | Agilent Technologies Osterrreich GmbH | en_US |
| dc.contributor.other | Mahidol University | en_US |
| dc.date.accessioned | 2018-06-11T04:32:36Z | |
| dc.date.available | 2018-06-11T04:32:36Z | |
| dc.date.issued | 2012-12-01 | en_US |
| dc.description.abstract | Atomic force microscopy (AFM) allows high-resolution topographical images to be obtained at the nanometer scale together with single molecule force measurements on biological samples in their physiological environment. Therefore, it is a powerful tool for detecting the forces and the dynamics of the interaction between individual ligands and receptors on cellular surfaces. This article describes sample preparation methods, different AFM imaging modes, AFM tip functionalization, current methodology, and applications of molecular recognition studies using AFM. © 2012 Elsevier B.V. All rights reserved. | en_US |
| dc.identifier.citation | Comprehensive Biophysics. Vol.2, (2012), 111-143 | en_US |
| dc.identifier.doi | 10.1016/B978-0-12-374920-8.00213-7 | en_US |
| dc.identifier.other | 2-s2.0-84882787867 | en_US |
| dc.identifier.uri | https://repository.li.mahidol.ac.th/handle/20.500.14594/13563 | |
| dc.rights | Mahidol University | en_US |
| dc.rights.holder | SCOPUS | en_US |
| dc.source.uri | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84882787867&origin=inward | en_US |
| dc.subject | Biochemistry, Genetics and Molecular Biology | en_US |
| dc.title | Atomic force microscopy | en_US |
| dc.type | Chapter | en_US |
| dspace.entity.type | Publication | |
| mu.datasource.scopus | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=84882787867&origin=inward | en_US |