Development of the Bipolar Junction Transistor Diagnostic Test (BJTDT) to explore the second-year undergraduate Myanmar electronic and Thai electrical engineering students’ understanding of BJT working principles and applications

Abstract

A bipolar junction transistor (BJT) and its operation are fundamental concepts for the understanding of power electronics (industrial electronics), transistor-transistor logic (TTL), electronic switching, and signal amplification in modern electronics. Previous research showed that non-major engineering, computer, electronic, and electrical engineering students could not understand the basic concepts involved in a BJT. This paper describes the development of a two-tier diagnostic test, the test’s administration, limitations, the participants’ detailed context, and findings from a study that explores Myanmar and Thai second-year undergraduate students’ understanding of BJT working principles and applications. The results revealed that many students in both countries had the same alternative conceptions about collector current in each operation mode of the BJT. Some alternative conceptions differ from the previous research, such as a) the collector current does not depend on the base current in cut-off mode, and b) changing the collector current does not depend on the base current in active mode, but it depends on the collector supply voltage. These research findings provide valuable information and instruments for teachers to insight, prevent, and correct the alternative conceptions proposed by students.