Publication:
Learning about modes in atomic force microscopy by means of hands-on activities based on a simple apparatus

Issued Date

2009-07-27

Resource Type

Article

ISSN

13616552
00319120

DOI

10.1088/0031-9120/44/3/012

Other identifier(s)

2-s2.0-67650809537

Rights

Mahidol University

Rights Holder(s)

SCOPUS

Bibliographic Citation

Physics Education. Vol.44, No.3 (2009), 306-309

Suggested Citation

Unchada Phuapaiboon, Bhinyo Panijpan, Tanakorn Osotchan Learning about modes in atomic force microscopy by means of hands-on activities based on a simple apparatus. Physics Education. Vol.44, No.3 (2009), 306-309. doi:10.1088/0031-9120/44/3/012 Retrieved from: https://repository.li.mahidol.ac.th/handle/20.500.14594/28344

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Title

Learning about modes in atomic force microscopy by means of hands-on activities based on a simple apparatus

Author(s)

Unchada Phuapaiboon
 Bhinyo Panijpan
 Tanakorn Osotchan

Other Contributor(s)

Mahidol University

Abstract

This study was conducted to examine the results of using a low-cost hands-on setup in combination with accompanying activities to promote understanding of the contact mode of atomic force microscopy (AFM). This contact mode setup enabled learners to study how AFM works by hand scanning using probing cantilevers with different characteristics on two types of artificial surface. They also learnt how to select the various probing cantilevers on the basis of their understanding of the advantages and disadvantages of using them. © 2009 IOP Publishing Ltd.

Keyword(s)

Physics and Astronomy
 Social Sciences

Availability

URI

https://repository.li.mahidol.ac.th/handle/20.500.14594/28344

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Scopus 2006-2010