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Learning about modes in atomic force microscopy by means of hands-on activities based on a simple apparatus

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dc.contributor.authorUnchada Phuapaiboonen_US
dc.contributor.authorBhinyo Panijpanen_US
dc.contributor.authorTanakorn Osotchanen_US
dc.contributor.otherMahidol Universityen_US
dc.date.accessioned2018-09-13T07:14:22Z
dc.date.available2018-09-13T07:14:22Z
dc.date.issued2009-07-27en_US
dc.description.abstractThis study was conducted to examine the results of using a low-cost hands-on setup in combination with accompanying activities to promote understanding of the contact mode of atomic force microscopy (AFM). This contact mode setup enabled learners to study how AFM works by hand scanning using probing cantilevers with different characteristics on two types of artificial surface. They also learnt how to select the various probing cantilevers on the basis of their understanding of the advantages and disadvantages of using them. © 2009 IOP Publishing Ltd.en_US
dc.identifier.citationPhysics Education. Vol.44, No.3 (2009), 306-309en_US
dc.identifier.doi10.1088/0031-9120/44/3/012en_US
dc.identifier.issn13616552en_US
dc.identifier.issn00319120en_US
dc.identifier.other2-s2.0-67650809537en_US
dc.identifier.urihttps://repository.li.mahidol.ac.th/handle/20.500.14594/28344
dc.rightsMahidol Universityen_US
dc.rights.holderSCOPUSen_US
dc.source.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=67650809537&origin=inwarden_US
dc.subjectPhysics and Astronomyen_US
dc.subjectSocial Sciencesen_US
dc.titleLearning about modes in atomic force microscopy by means of hands-on activities based on a simple apparatusen_US
dc.typeArticleen_US
dspace.entity.typePublication
mu.datasource.scopushttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=67650809537&origin=inwarden_US

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