Open Materials Science Journal. Vol.3, (2009), 50-55
Suggested Citation
Darapond Triampo, Wannapong Triampo The working of the atomic force microscope for chemical mapping. Open Materials Science Journal. Vol.3, (2009), 50-55. doi:10.2174/1874088X00903010050 Retrieved from: https://repository.li.mahidol.ac.th/handle/20.500.14594/27755
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The working of the atomic force microscope for chemical mapping
Since the invention of the scanning tunneling microscope (STM) in 1981 and the atomic force microscope (AFM) in 1986, over 5,000 publications have cited the article "Atomic Force Microscope" by G. Binnig, C.F. Quate, and C. Gerber (published in Physical Review Letters, 1986). This article presents a short review on the operating principle and possible applications of AFM with special attention devoted to chemical mapping. The article would be useful for beginners in AFM technique.
