Publication: The working of the atomic force microscope for chemical mapping
dc.contributor.author | Darapond Triampo | en_US |
dc.contributor.author | Wannapong Triampo | en_US |
dc.contributor.other | Mahidol University | en_US |
dc.date.accessioned | 2018-09-13T06:45:30Z | |
dc.date.available | 2018-09-13T06:45:30Z | |
dc.date.issued | 2009-10-13 | en_US |
dc.description.abstract | Since the invention of the scanning tunneling microscope (STM) in 1981 and the atomic force microscope (AFM) in 1986, over 5,000 publications have cited the article "Atomic Force Microscope" by G. Binnig, C.F. Quate, and C. Gerber (published in Physical Review Letters, 1986). This article presents a short review on the operating principle and possible applications of AFM with special attention devoted to chemical mapping. The article would be useful for beginners in AFM technique. | en_US |
dc.identifier.citation | Open Materials Science Journal. Vol.3, (2009), 50-55 | en_US |
dc.identifier.doi | 10.2174/1874088X00903010050 | en_US |
dc.identifier.issn | 1874088X | en_US |
dc.identifier.other | 2-s2.0-78651572988 | en_US |
dc.identifier.uri | https://repository.li.mahidol.ac.th/handle/20.500.14594/27755 | |
dc.rights | Mahidol University | en_US |
dc.rights.holder | SCOPUS | en_US |
dc.source.uri | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=78651572988&origin=inward | en_US |
dc.subject | Materials Science | en_US |
dc.title | The working of the atomic force microscope for chemical mapping | en_US |
dc.type | Review | en_US |
dspace.entity.type | Publication | |
mu.datasource.scopus | https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=78651572988&origin=inward | en_US |