Publication:
The working of the atomic force microscope for chemical mapping

dc.contributor.authorDarapond Triampoen_US
dc.contributor.authorWannapong Triampoen_US
dc.contributor.otherMahidol Universityen_US
dc.date.accessioned2018-09-13T06:45:30Z
dc.date.available2018-09-13T06:45:30Z
dc.date.issued2009-10-13en_US
dc.description.abstractSince the invention of the scanning tunneling microscope (STM) in 1981 and the atomic force microscope (AFM) in 1986, over 5,000 publications have cited the article "Atomic Force Microscope" by G. Binnig, C.F. Quate, and C. Gerber (published in Physical Review Letters, 1986). This article presents a short review on the operating principle and possible applications of AFM with special attention devoted to chemical mapping. The article would be useful for beginners in AFM technique.en_US
dc.identifier.citationOpen Materials Science Journal. Vol.3, (2009), 50-55en_US
dc.identifier.doi10.2174/1874088X00903010050en_US
dc.identifier.issn1874088Xen_US
dc.identifier.other2-s2.0-78651572988en_US
dc.identifier.urihttps://repository.li.mahidol.ac.th/handle/20.500.14594/27755
dc.rightsMahidol Universityen_US
dc.rights.holderSCOPUSen_US
dc.source.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=78651572988&origin=inwarden_US
dc.subjectMaterials Scienceen_US
dc.titleThe working of the atomic force microscope for chemical mappingen_US
dc.typeReviewen_US
dspace.entity.typePublication
mu.datasource.scopushttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=78651572988&origin=inwarden_US

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