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Investigation of the use of rotating linearly polarized light for characterizing SiO<inf>2</inf> thin-film on Si substrate

Citation
C. Pawong, R. Chitaree, C. Soankwan (2011). Investigation of the use of rotating linearly polarized light for characterizing SiO<inf>2</inf> thin-film on Si substrate. Retrieved from: https://repository.li.mahidol.ac.th/handle/123456789/12836.
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